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Reliability challenges in integrated high voltage devices

dc.contributor.authorMoens, Peter
dc.contributor.authorVan den Bosch, Geert
dc.date.accessioned2021-10-16T03:29:06Z
dc.date.available2021-10-16T03:29:06Z
dc.date.issued2005
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/10896
dc.sourceIIOimport
dc.titleReliability challenges in integrated high voltage devices
dc.typeOral presentation
dc.contributor.imecauthorMoens, Peter
dc.contributor.imecauthorVan den Bosch, Geert
dc.contributor.orcidimecVan den Bosch, Geert::0000-0001-9971-6954
dc.source.peerreviewno
dc.source.conferenceInternational Reliability Physics Symposium (IRPS)
dc.source.conferencedate17/04/2005
dc.source.conferencelocationSan Jose, CA USA
imec.availabilityPublished - imec
imec.internalnotesTutorial


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