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CuTCNQ based organic non-volatile memories: downscaling, stress tests, and temperature effect on I-V curves

dc.contributor.authorMuller, Robert
dc.contributor.authorGenoe, Jan
dc.contributor.authorHeremans, Paul
dc.date.accessioned2021-10-16T03:34:53Z
dc.date.available2021-10-16T03:34:53Z
dc.date.issued2005
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/10916
dc.sourceIIOimport
dc.titleCuTCNQ based organic non-volatile memories: downscaling, stress tests, and temperature effect on I-V curves
dc.typeProceedings paper
dc.contributor.imecauthorGenoe, Jan
dc.contributor.imecauthorHeremans, Paul
dc.contributor.orcidimecGenoe, Jan::0000-0002-4019-5979
dc.contributor.orcidimecHeremans, Paul::0000-0003-2151-1718
dc.source.peerreviewno
dc.source.beginpage181
dc.source.endpage183
dc.source.conferenceProceedings 1st International Conference on Memory Technology and Design
dc.source.conferencedate21/05/2005
dc.source.conferencelocationGiens France
imec.availabilityPublished - imec


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