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A study of the influence of typical wet chemical treatments on the germanium wafer surface
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Authors
Onsia, Bart
;
Conard, Thierry
;
De Gendt, Stefan
;
Heyns, Marc
;
Hoflijk, Ilse
;
Mertens, Paul
;
Meuris, Peter
;
Raskin, G.
;
Sioncke, Sonja
;
Teerlinck, Ivo
;
Theuwis, A.
;
Van Steenbergen, Jan
;
Vinckier, Chris
Conference
Ultra Clean Processing of Silicon Surfaces VII: Proceedings of the 7th International Symposium
Title
A study of the influence of typical wet chemical treatments on the germanium wafer surface
Publication type
Proceedings paper
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