Show simple item record

Failure mechanisms and qualification testing of passive components

dc.contributor.authorPost, H.A.
dc.contributor.authorLetullier, P.
dc.contributor.authorBriolat, T.
dc.contributor.authorHumke, R.
dc.contributor.authorSchuhmann, R.
dc.contributor.authorSaarinen, K.
dc.contributor.authorWerner, W.
dc.contributor.authorOusten, Y.
dc.contributor.authorLekens, Geert
dc.contributor.authorDehbi, A.
dc.contributor.authorWondrak, W.
dc.date.accessioned2021-10-16T04:12:13Z
dc.date.available2021-10-16T04:12:13Z
dc.date.issued2005
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/11043
dc.sourceIIOimport
dc.titleFailure mechanisms and qualification testing of passive components
dc.typeJournal article
dc.contributor.imecauthorLekens, Geert
dc.source.peerreviewno
dc.source.beginpage1626
dc.source.endpage1632
dc.source.journalMicroelectronics Reliability
dc.source.issue9_11
dc.source.volume45
imec.availabilityPublished - imec
imec.internalnotesPaper from 16th ESREF conference


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record