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Failure mechanisms and qualification testing of passive components
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Failure mechanisms and qualification testing of passive components
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Date
2005
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Post, H.A.
;
Letullier, P.
;
Briolat, T.
;
Humke, R.
;
Schuhmann, R.
;
Saarinen, K.
;
Werner, W.
;
Ousten, Y.
;
Lekens, Geert
;
Dehbi, A.
;
Wondrak, W.
Journal
Microelectronics Reliability
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1970
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Acq. date: 2025-12-17
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Metrics
Views
1970
since deposited on 2021-10-16
1
last month
1
last week
Acq. date: 2025-12-17
Citations