Publication:
Failure mechanisms and qualification testing of passive components
Date
| dc.contributor.author | Post, H.A. | |
| dc.contributor.author | Letullier, P. | |
| dc.contributor.author | Briolat, T. | |
| dc.contributor.author | Humke, R. | |
| dc.contributor.author | Schuhmann, R. | |
| dc.contributor.author | Saarinen, K. | |
| dc.contributor.author | Werner, W. | |
| dc.contributor.author | Ousten, Y. | |
| dc.contributor.author | Lekens, Geert | |
| dc.contributor.author | Dehbi, A. | |
| dc.contributor.author | Wondrak, W. | |
| dc.contributor.imecauthor | Lekens, Geert | |
| dc.date.accessioned | 2021-10-16T04:12:13Z | |
| dc.date.available | 2021-10-16T04:12:13Z | |
| dc.date.issued | 2005 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/11043 | |
| dc.source.beginpage | 1626 | |
| dc.source.endpage | 1632 | |
| dc.source.issue | 9_11 | |
| dc.source.journal | Microelectronics Reliability | |
| dc.source.volume | 45 | |
| dc.title | Failure mechanisms and qualification testing of passive components | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
| Publication available in collections: |