Authors

Redant, Steven; Marec, R.; Baguena, L.; Liegeon, E.; Soucarre, J.; Van Thielen, Bert; Beeckman, Gerd; Ribeiro, P.; Fernandez-Leon, A.; Glass, B.

Issue

5

Journal

IEEE Trans. Nuclear Science

Volume

52

Title

Radiation test results on first silicon in the Design Against Radiation Effects (DARE) library

Publication type

Journal article