Radiation test results on first silicon in the Design Against Radiation Effects (DARE) library
dc.contributor.author | Redant, Steven | |
dc.contributor.author | Marec, R. | |
dc.contributor.author | Baguena, L. | |
dc.contributor.author | Liegeon, E. | |
dc.contributor.author | Soucarre, J. | |
dc.contributor.author | Van Thielen, Bert | |
dc.contributor.author | Beeckman, Gerd | |
dc.contributor.author | Ribeiro, P. | |
dc.contributor.author | Fernandez-Leon, A. | |
dc.contributor.author | Glass, B. | |
dc.date.accessioned | 2021-10-16T04:27:16Z | |
dc.date.available | 2021-10-16T04:27:16Z | |
dc.date.issued | 2005 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/11091 | |
dc.source | IIOimport | |
dc.title | Radiation test results on first silicon in the Design Against Radiation Effects (DARE) library | |
dc.type | Journal article | |
dc.contributor.imecauthor | Redant, Steven | |
dc.source.peerreview | no | |
dc.source.beginpage | 1550 | |
dc.source.endpage | 1554 | |
dc.source.journal | IEEE Trans. Nuclear Science | |
dc.source.issue | 5 | |
dc.source.volume | 52 | |
imec.availability | Published - imec |
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