Show simple item record

Mixed-signal and noise properties of nMOSFETs with HfSiON/TaN gate stacks

dc.contributor.authorRittersma, Chris
dc.contributor.authorSimoen, Eddy
dc.contributor.authorSrinivasan, Purushothaman
dc.contributor.authorVertregt, M.
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-10-16T04:32:12Z
dc.date.available2021-10-16T04:32:12Z
dc.date.issued2005
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/11107
dc.sourceIIOimport
dc.titleMixed-signal and noise properties of nMOSFETs with HfSiON/TaN gate stacks
dc.typeProceedings paper
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.source.peerreviewno
dc.source.beginpage105
dc.source.endpage108
dc.source.conferenceProceedings of the 35th European Solid-State Device Research Conference - ESSDERC
dc.source.conferencedate13/09/2005
dc.source.conferencelocationGrenoble France
imec.availabilityPublished - imec


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record