dc.contributor.author | Shamiryan, Denis | |
dc.contributor.author | Paraschiv, Vasile | |
dc.contributor.author | Tokei, Zsolt | |
dc.contributor.author | Boullart, Werner | |
dc.date.accessioned | 2021-10-16T05:00:19Z | |
dc.date.available | 2021-10-16T05:00:19Z | |
dc.date.issued | 2005 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/11194 | |
dc.source | IIOimport | |
dc.title | Influence of TaN microstructure on its etch properties | |
dc.type | Meeting abstract | |
dc.contributor.imecauthor | Paraschiv, Vasile | |
dc.contributor.imecauthor | Tokei, Zsolt | |
dc.contributor.imecauthor | Boullart, Werner | |
dc.contributor.orcidimec | Boullart, Werner::0000-0001-7614-2097 | |
dc.source.peerreview | no | |
dc.source.beginpage | 563 | |
dc.source.conference | Meeting Abstracts 208th Electrochemical Society Meeting | |
dc.source.conferencedate | 16/10/2005 | |
dc.source.conferencelocation | Los Angeles, CA USA | |
imec.availability | Published - imec | |