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On the electrical activity of misfit and threading dislocations in P-N junctions fabricated in thin strain-relaxed buffer layers

dc.contributor.authorSimoen, Eddy
dc.contributor.authorEneman, Geert
dc.contributor.authorShamuilia, Sheron
dc.contributor.authorSimons, Veerle
dc.contributor.authorGaubas, E.
dc.contributor.authorDelhougne, Romain
dc.contributor.authorLoo, Roger
dc.contributor.authorDe Meyer, Kristin
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-10-16T05:04:52Z
dc.date.available2021-10-16T05:04:52Z
dc.date.issued2005
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/11208
dc.sourceIIOimport
dc.titleOn the electrical activity of misfit and threading dislocations in P-N junctions fabricated in thin strain-relaxed buffer layers
dc.typeProceedings paper
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorEneman, Geert
dc.contributor.imecauthorSimons, Veerle
dc.contributor.imecauthorDelhougne, Romain
dc.contributor.imecauthorLoo, Roger
dc.contributor.imecauthorDe Meyer, Kristin
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecEneman, Geert::0000-0002-5849-3384
dc.contributor.orcidimecSimons, Veerle::0000-0001-5714-955X
dc.contributor.orcidimecLoo, Roger::0000-0003-3513-6058
dc.source.peerreviewno
dc.source.beginpage285
dc.source.endpage290
dc.source.conferenceGettering and Defect Engineering in Semiconductor Technology XI. Proceedings of the 11th International Autumn Meeting
dc.source.conferencedate25/09/2005
dc.source.conferencelocationGiens France
imec.availabilityPublished - imec
imec.internalnotesSolid-State Phenomena; Vols. 108-109


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