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Exploring the limits of stress-enhanced hole mobility

dc.contributor.authorSmith, Lee
dc.contributor.authorMoroz, Victor
dc.contributor.authorEneman, Geert
dc.contributor.authorVerheyen, Peter
dc.contributor.authorNouri, Faran
dc.contributor.authorWashington, Lori
dc.contributor.authorJurczak, Gosia
dc.contributor.authorPenzin, Oleg
dc.contributor.authorPramanik, Dipu
dc.contributor.authorDe Meyer, Kristin
dc.date.accessioned2021-10-16T05:09:33Z
dc.date.available2021-10-16T05:09:33Z
dc.date.issued2005-09
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/11221
dc.sourceIIOimport
dc.titleExploring the limits of stress-enhanced hole mobility
dc.typeJournal article
dc.contributor.imecauthorEneman, Geert
dc.contributor.imecauthorVerheyen, Peter
dc.contributor.imecauthorJurczak, Gosia
dc.contributor.imecauthorDe Meyer, Kristin
dc.contributor.orcidimecEneman, Geert::0000-0002-5849-3384
dc.source.peerreviewno
dc.source.beginpage652
dc.source.endpage654
dc.source.journalIEEE Electron Device Letters
dc.source.issue9
dc.source.volume26
imec.availabilityPublished - imec


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