Exploring the limits of stress-enhanced hole mobility

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Authors

Smith, Lee; Moroz, Victor; Eneman, Geert; Verheyen, Peter; Nouri, Faran; Washington, Lori; Jurczak, Gosia; Penzin, Oleg; Pramanik, Dipu; De Meyer, Kristin

Issue

9

Journal

IEEE Electron Device Letters

Volume

26

Title

Exploring the limits of stress-enhanced hole mobility

Publication type

Journal article

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