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Articles
Exploring the limits of stress-enhanced hole mobility
Publication:
Exploring the limits of stress-enhanced hole mobility
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Date
2005-09
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Smith, Lee
;
Moroz, Victor
;
Eneman, Geert
;
Verheyen, Peter
;
Nouri, Faran
;
Washington, Lori
;
Jurczak, Gosia
;
Penzin, Oleg
;
Pramanik, Dipu
;
De Meyer, Kristin
Journal
IEEE Electron Device Letters
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1926
since deposited on 2021-10-16
Acq. date: 2025-12-09
Citations
Metrics
Views
1926
since deposited on 2021-10-16
Acq. date: 2025-12-09
Citations