Publication:

Exploring the limits of stress-enhanced hole mobility

Date

2005-09
Journal article
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dc.contributor.authorSmith, Lee
dc.contributor.authorMoroz, Victor
dc.contributor.authorEneman, Geert
dc.contributor.authorVerheyen, Peter
dc.contributor.authorNouri, Faran
dc.contributor.authorWashington, Lori
dc.contributor.authorJurczak, Gosia
dc.contributor.authorPenzin, Oleg
dc.contributor.authorPramanik, Dipu
dc.contributor.authorDe Meyer, Kristin
dc.contributor.imecauthorEneman, Geert
dc.contributor.imecauthorVerheyen, Peter
dc.contributor.imecauthorJurczak, Gosia
dc.contributor.imecauthorDe Meyer, Kristin
dc.contributor.orcidimecEneman, Geert::0000-0002-5849-3384
dc.date.accessioned2021-10-16T05:09:33Z
dc.date.available2021-10-16T05:09:33Z
dc.date.issued2005-09
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/11221
dc.source.beginpage652
dc.source.endpage654
dc.source.issue9
dc.source.journalIEEE Electron Device Letters
dc.source.volume26
dc.title

Exploring the limits of stress-enhanced hole mobility

dc.typeJournal article
dspace.entity.typePublication
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