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Process- and irradiation-induced defects in silicon devices
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Process- and irradiation-induced defects in silicon devices
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Date
1996
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Claeys, Cor
;
Simoen, Eddy
;
Vanhellemont, Jan
Journal
Nuclear Instruments and Methods in Physics Research A
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1883
since deposited on 2021-09-29
Acq. date: 2025-12-16
Citations
Metrics
Views
1883
since deposited on 2021-09-29
Acq. date: 2025-12-16
Citations