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dc.contributor.authorSubramanian, Vaidy
dc.contributor.authorMercha, Abdelkarim
dc.contributor.authorDixit, Abhisek
dc.contributor.authorKottantharayil, Anil
dc.contributor.authorJurczak, Gosia
dc.contributor.authorDe Meyer, Kristin
dc.contributor.authorDecoutere, Stefaan
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2021-10-16T05:32:16Z
dc.date.available2021-10-16T05:32:16Z
dc.date.issued2005
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/11290
dc.sourceIIOimport
dc.titleGeometry dependence of low frequency noise in n- and p- channel MuGFETs
dc.typeProceedings paper
dc.contributor.imecauthorMercha, Abdelkarim
dc.contributor.imecauthorJurczak, Gosia
dc.contributor.imecauthorDe Meyer, Kristin
dc.contributor.imecauthorDecoutere, Stefaan
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecMercha, Abdelkarim::0000-0002-2174-6958
dc.contributor.orcidimecDecoutere, Stefaan::0000-0001-6632-6239
dc.source.peerreviewno
dc.source.beginpage279
dc.source.endpage282
dc.source.conferenceNoise and Fluctuations: 18th International Conference on Noise and Fluctuations - ICNF
dc.source.conferencedate19/09/2005
dc.source.conferencelocationSalamanca Spain
imec.availabilityPublished - imec
imec.internalnotesAIP Conference Proceedings; Vol. 780


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