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Device and circuit-level analog performance trade-offs: a comparative study of planar bulk FETs versus FinFETs

dc.contributor.authorSubramanian, Vaidy
dc.contributor.authorParvais, Bertrand
dc.contributor.authorBorremans, Jonathan
dc.contributor.authorMercha, Abdelkarim
dc.contributor.authorLinten, Dimitri
dc.contributor.authorWambacq, Piet
dc.contributor.authorLoo, Josine
dc.contributor.authorDehan, Morin
dc.contributor.authorCollaert, Nadine
dc.contributor.authorKubicek, Stefan
dc.contributor.authorLander, Rob
dc.contributor.authorHooker, Jacob
dc.contributor.authorCubaynes, Florence
dc.contributor.authorDonnay, Stephane
dc.contributor.authorJurczak, Gosia
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorSansen, Willy
dc.contributor.authorDecoutere, Stefaan
dc.date.accessioned2021-10-16T05:32:46Z
dc.date.available2021-10-16T05:32:46Z
dc.date.issued2005
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/11291
dc.sourceIIOimport
dc.titleDevice and circuit-level analog performance trade-offs: a comparative study of planar bulk FETs versus FinFETs
dc.typeProceedings paper
dc.contributor.imecauthorParvais, Bertrand
dc.contributor.imecauthorMercha, Abdelkarim
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorWambacq, Piet
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.imecauthorKubicek, Stefan
dc.contributor.imecauthorDonnay, Stephane
dc.contributor.imecauthorJurczak, Gosia
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorDecoutere, Stefaan
dc.contributor.orcidimecParvais, Bertrand::0000-0003-0769-7069
dc.contributor.orcidimecMercha, Abdelkarim::0000-0002-2174-6958
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.contributor.orcidimecWambacq, Piet::0000-0003-4388-7257
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.contributor.orcidimecDonnay, Stephane::0000-0003-2489-4793
dc.contributor.orcidimecDecoutere, Stefaan::0000-0001-6632-6239
dc.source.peerreviewno
dc.source.beginpage36-5-1
dc.source.endpage36-5-4
dc.source.conferenceTechnical Digest International Electronic Devices Meeting - IEDM
dc.source.conferencedate5/12/2005
dc.source.conferencelocationWashington, D.C. USA
imec.availabilityPublished - imec


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