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Surface characterization using TIRF microscopy

dc.contributor.authorThoelen, R.
dc.contributor.authorDaenen, M.
dc.contributor.authorWilliams, O.A.
dc.contributor.authorVermeeren, V.
dc.contributor.authorGielen, E.
dc.contributor.authorHellings, N.
dc.contributor.authorHaenen, Ken
dc.contributor.authorManca, Jean
dc.contributor.authorWagner, P.
dc.contributor.authorAmeloot, M.
dc.contributor.authorMichiels, L.
dc.contributor.authorvandeVen, M.
dc.date.accessioned2021-10-16T05:39:19Z
dc.date.available2021-10-16T05:39:19Z
dc.date.issued2005
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/11309
dc.sourceIIOimport
dc.titleSurface characterization using TIRF microscopy
dc.typeOral presentation
dc.contributor.imecauthorHaenen, Ken
dc.contributor.orcidimecHaenen, Ken::0000-0001-6711-7367
dc.source.peerreviewno
dc.source.conferenceSurface and Bulk Defects in CVD Diamond Films X
dc.source.conferencedate23/02/2005
dc.source.conferencelocationDiepenbeek Belgium
imec.availabilityPublished - imec


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