dc.contributor.author | Van den Bosch, Geert | |
dc.contributor.author | Webers, Tomas | |
dc.contributor.author | Driessens, Evelien | |
dc.contributor.author | Elattari, Brahim | |
dc.contributor.author | Wojciechowski, Dominique | |
dc.contributor.author | Gassot, Pierre | |
dc.contributor.author | Moens, Peter | |
dc.contributor.author | Groeseneken, Guido | |
dc.date.accessioned | 2021-10-16T06:01:05Z | |
dc.date.available | 2021-10-16T06:01:05Z | |
dc.date.issued | 2005-04 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/11371 | |
dc.source | IIOimport | |
dc.title | Design and characterization of a post-processed copper heat sink for smart power drivers | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Van den Bosch, Geert | |
dc.contributor.imecauthor | Webers, Tomas | |
dc.contributor.imecauthor | Moens, Peter | |
dc.contributor.imecauthor | Groeseneken, Guido | |
dc.contributor.orcidimec | Van den Bosch, Geert::0000-0001-9971-6954 | |
dc.source.peerreview | no | |
dc.source.beginpage | 27 | |
dc.source.endpage | 31 | |
dc.source.conference | IEEE International Conference on Microelectronic Test Structures | |
dc.source.conferencedate | 4/04/2005 | |
dc.source.conferencelocation | Leuven Belgium | |
imec.availability | Published - imec | |