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Characterization of dynamic SOA of power MOSFETs limited by electrothermal breakdown

dc.contributor.authorVan den Bosch, Geert
dc.contributor.authorWojciechowski, Dominique
dc.contributor.authorElattari, Brahim
dc.contributor.authorMoens, Peter
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2021-10-16T06:01:27Z
dc.date.available2021-10-16T06:01:27Z
dc.date.issued2005-09
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/11372
dc.sourceIIOimport
dc.titleCharacterization of dynamic SOA of power MOSFETs limited by electrothermal breakdown
dc.typeProceedings paper
dc.contributor.imecauthorVan den Bosch, Geert
dc.contributor.imecauthorMoens, Peter
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecVan den Bosch, Geert::0000-0001-9971-6954
dc.source.peerreviewno
dc.source.beginpage465
dc.source.endpage468
dc.source.conferenceProceedings of the 35th European Solid-State Device Research Conference - ESSDERC
dc.source.conferencedate12/09/2005
dc.source.conferencelocationGrenoble France
imec.availabilityPublished - imec


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