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Substrate noise coupling: accurate modeling for deep sub-micron technologies

dc.contributor.authorVan der Plas, Geert
dc.date.accessioned2021-10-16T06:04:03Z
dc.date.available2021-10-16T06:04:03Z
dc.date.issued2005
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/11380
dc.sourceIIOimport
dc.titleSubstrate noise coupling: accurate modeling for deep sub-micron technologies
dc.typeOral presentation
dc.contributor.imecauthorVan der Plas, Geert
dc.contributor.orcidimecVan der Plas, Geert::0000-0002-4975-6672
dc.source.peerreviewno
dc.source.conferenceDesign Automation and Test in Europe Conference - DATE
dc.source.conferencedate6/03/2005
dc.source.conferencelocationMünchen Germany
imec.availabilityPublished - imec
imec.internalnotestutorial


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