dc.contributor.author | Van Hove, Marleen | |
dc.contributor.author | Travaly, Youssef | |
dc.contributor.author | Sajavaara, Timo | |
dc.contributor.author | Brijs, Bert | |
dc.contributor.author | Vandervorst, Wilfried | |
dc.contributor.author | Lauwers, Anne | |
dc.contributor.author | Chamirian, Oxana | |
dc.contributor.author | Kittl, Jorge | |
dc.contributor.author | Jonas, Alain | |
dc.contributor.author | Maex, Karen | |
dc.date.accessioned | 2021-10-16T06:13:29Z | |
dc.date.available | 2021-10-16T06:13:29Z | |
dc.date.issued | 2005 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/11406 | |
dc.source | IIOimport | |
dc.title | Study of thermal stability of nickel silicide by x-ray reflectivity | |
dc.type | Journal article | |
dc.contributor.imecauthor | Vandervorst, Wilfried | |
dc.contributor.imecauthor | Lauwers, Anne | |
dc.contributor.imecauthor | Maex, Karen | |
dc.source.peerreview | no | |
dc.source.beginpage | 492 | |
dc.source.endpage | 496 | |
dc.source.journal | Microelectronic Engineering | |
dc.source.issue | 3_4 | |
dc.source.volume | 82 | |
imec.availability | Published - imec | |
imec.internalnotes | Proc. 9th Eur. Workshop on Materials for Advanced Metallization; March 2005; Dresden | |