Show simple item record

The influence of the package environment on the functioning and reliability of RF-MEMS switches

dc.contributor.authorvan Spengen, Merlijn
dc.contributor.authorCzarnecki, Piotr
dc.contributor.authorPuers, Bob
dc.contributor.authorvan Beek, Joost T.M.
dc.contributor.authorDe Wolf, Ingrid
dc.date.accessioned2021-10-16T06:24:15Z
dc.date.available2021-10-16T06:24:15Z
dc.date.issued2005
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/11437
dc.sourceIIOimport
dc.titleThe influence of the package environment on the functioning and reliability of RF-MEMS switches
dc.typeProceedings paper
dc.contributor.imecauthorCzarnecki, Piotr
dc.contributor.imecauthorPuers, Bob
dc.contributor.imecauthorDe Wolf, Ingrid
dc.contributor.orcidimecDe Wolf, Ingrid::0000-0003-3822-5953
dc.source.peerreviewno
dc.source.beginpage337
dc.source.endpage341
dc.source.conference43rd Annual IEEE International Reliability Physics Symposium Proceedings
dc.source.conferencedate17/04/2005
dc.source.conferencelocationSan Jose, CA USA
imec.availabilityPublished - imec


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record