dc.contributor.author | Vassilev, Vesselin | |
dc.contributor.author | Thijs, Steven | |
dc.contributor.author | Segura, Pablo | |
dc.contributor.author | Wambacq, Piet | |
dc.contributor.author | Leroux, Paul | |
dc.contributor.author | Mahadeva Iyer, Natarajan | |
dc.contributor.author | Maes, Herman | |
dc.contributor.author | Steyaert, Michiel | |
dc.date.accessioned | 2021-10-16T06:41:35Z | |
dc.date.available | 2021-10-16T06:41:35Z | |
dc.date.issued | 2005 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/11486 | |
dc.source | IIOimport | |
dc.title | ESD-RF co-design methodology for the state of the art RF-CMOS blocks | |
dc.type | Journal article | |
dc.contributor.imecauthor | Thijs, Steven | |
dc.contributor.imecauthor | Wambacq, Piet | |
dc.contributor.orcidimec | Thijs, Steven::0000-0003-2889-8345 | |
dc.contributor.orcidimec | Wambacq, Piet::0000-0003-4388-7257 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.beginpage | 255 | |
dc.source.endpage | 268 | |
dc.source.journal | Microelectronics and Reliability | |
dc.source.issue | 2 | |
dc.source.volume | 45 | |
imec.availability | Published - open access | |