ESD-RF co-design methodology for the state of the art RF-CMOS blocks

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Authors

Vassilev, Vesselin; Thijs, Steven; Segura, Pablo; Wambacq, Piet; Leroux, Paul; Mahadeva Iyer, Natarajan; Maes, Herman; Steyaert, Michiel

Issue

2

Journal

Microelectronics and Reliability

Volume

45

Title

ESD-RF co-design methodology for the state of the art RF-CMOS blocks

Publication type

Journal article

Embargo date

9999-12-31

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