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ESD-RF co-design methodology for the state of the art RF-CMOS blocks

Date

2005
Journal article
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dc.contributor.authorVassilev, Vesselin
dc.contributor.authorThijs, Steven
dc.contributor.authorSegura, Pablo
dc.contributor.authorWambacq, Piet
dc.contributor.authorLeroux, Paul
dc.contributor.authorMahadeva Iyer, Natarajan
dc.contributor.authorMaes, Herman
dc.contributor.authorSteyaert, Michiel
dc.contributor.imecauthorThijs, Steven
dc.contributor.imecauthorWambacq, Piet
dc.contributor.orcidimecThijs, Steven::0000-0003-2889-8345
dc.contributor.orcidimecWambacq, Piet::0000-0003-4388-7257
dc.date.accessioned2021-10-16T06:41:35Z
dc.date.available2021-10-16T06:41:35Z
dc.date.embargo9999-12-31
dc.date.issued2005
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/11486
dc.source.beginpage255
dc.source.endpage268
dc.source.issue2
dc.source.journalMicroelectronics and Reliability
dc.source.volume45
dc.title

ESD-RF co-design methodology for the state of the art RF-CMOS blocks

dc.typeJournal article
dspace.entity.typePublication
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