Show simple item record

Systematic analysis of energy and delay impact of very deep submicron process variability effects in embedded SRAM modules

dc.contributor.authorWang, Hua
dc.contributor.authorMiranda, Miguel
dc.contributor.authorDehaene, Wim
dc.contributor.authorCatthoor, Francky
dc.contributor.authorMaex, Karen
dc.date.accessioned2021-10-16T07:01:09Z
dc.date.available2021-10-16T07:01:09Z
dc.date.issued2005-03
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/11538
dc.sourceIIOimport
dc.titleSystematic analysis of energy and delay impact of very deep submicron process variability effects in embedded SRAM modules
dc.typeProceedings paper
dc.contributor.imecauthorDehaene, Wim
dc.contributor.imecauthorCatthoor, Francky
dc.contributor.imecauthorMaex, Karen
dc.contributor.orcidimecCatthoor, Francky::0000-0002-3599-8515
dc.source.peerreviewno
dc.source.beginpage914
dc.source.endpage919
dc.source.conferenceProceedings of the Design, Automation and Test in Europe Conference and Exhibition - DATE
dc.source.conferencedate7/03/2005
dc.source.conferencelocationMünchen Germany
imec.availabilityPublished - imec


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record