Show simple item record

Electrical characterization of SrBi2Ta2O2O9(SBT)/high-k gate stack in metal-ferroelectric-insulator-semiconductor structure

dc.contributor.authorXu, Zhen
dc.date.accessioned2021-10-16T07:17:43Z
dc.date.available2021-10-16T07:17:43Z
dc.date.issued2005-09
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/11580
dc.sourceIIOimport
dc.titleElectrical characterization of SrBi2Ta2O2O9(SBT)/high-k gate stack in metal-ferroelectric-insulator-semiconductor structure
dc.typePHD thesis
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.contributor.thesisadvisorGroeseneken, Guido
dc.contributor.thesisadvisorMaes, Herman
imec.availabilityPublished - open access


Files in this item

Thumbnail
Name:
12170.pdf
Size:
1.254Mb
Format:
PDF
View/open

This item appears in the following collection(s)

Show simple item record