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Electrical characterization of SrBi2Ta2O2O9(SBT)/high-k gate stack in metal-ferroelectric-insulator-semiconductor structure
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1920 since deposited on 2021-10-16
Acq. date: 2026-01-07
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1920 since deposited on 2021-10-16
Acq. date: 2026-01-07
Citations