Publication:

Electrical characterization of SrBi2Ta2O2O9(SBT)/high-k gate stack in metal-ferroelectric-insulator-semiconductor structure

Date

Loading...
Thumbnail Image

Author(s)

Journal

Abstract

Description

Metrics

Views

1919 since deposited on 2021-10-16
Acq. date: 2025-10-23

Citations

Metrics

Views

1919 since deposited on 2021-10-16
Acq. date: 2025-10-23

Citations