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Scanning spreading resistance microscopy for the characterization of advanced silicon devices
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Scanning spreading resistance microscopy for the characterization of advanced silicon devices
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Date
2007-01
Dissertation
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14766.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Alvarez, David
Journal
Abstract
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1930
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Acq. date: 2026-01-10
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Views
1930
since deposited on 2021-10-16
2
last month
1
last week
Acq. date: 2026-01-10
Citations