Scanning spreading resistance microscopy for the characterization of advanced silicon devices
dc.contributor.author | Alvarez, David | |
dc.date.accessioned | 2021-10-16T15:00:28Z | |
dc.date.available | 2021-10-16T15:00:28Z | |
dc.date.issued | 2007-01 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/11642 | |
dc.source | IIOimport | |
dc.title | Scanning spreading resistance microscopy for the characterization of advanced silicon devices | |
dc.type | PHD thesis | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.contributor.thesisadvisor | Vandervorst, Wilfried | |
imec.availability | Published - open access |