A new lateral-IGBT structure with a wider safe operating area

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15237.pdf 279.63 KB

Author(s)

Bakeroot, Benoit

;

Doutreloigne, Jan

;

Vanmeerbeek, P.

;

Journal

IEEE Electron Device Letters

Metrics

1901 since deposited on 2021-10-16

1last month

Acq. date: 2025-12-08