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Cesium near-surface concentration in low energy, negative mode dynamic SIMS

dc.contributor.authorBerghmans, Bart
dc.contributor.authorVan Daele, Benny
dc.contributor.authorGeenen, Luc
dc.contributor.authorConard, Thierry
dc.contributor.authorFranquet, Alexis
dc.contributor.authorVandervorst, Wilfried
dc.date.accessioned2021-10-16T15:04:01Z
dc.date.available2021-10-16T15:04:01Z
dc.date.issued2007-10
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/11719
dc.sourceIIOimport
dc.titleCesium near-surface concentration in low energy, negative mode dynamic SIMS
dc.typeMeeting abstract
dc.contributor.imecauthorConard, Thierry
dc.contributor.imecauthorFranquet, Alexis
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.orcidimecConard, Thierry::0000-0002-4298-5851
dc.contributor.orcidimecFranquet, Alexis::0000-0002-7371-8852
dc.source.peerreviewyes
dc.source.conferenceSIMS XVI
dc.source.conferencedate29/10/2007
dc.source.conferencelocationKanazawa Japan
imec.availabilityPublished - imec
imec.internalnotesto be publ. Applied Surface Science 2008


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