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Improved CuTCNQ resistive non-volatile memories and a statistical study on their threshold voltage

dc.contributor.authorBillen, Joris
dc.contributor.authorMuller, Robert
dc.contributor.authorGenoe, Jan
dc.contributor.authorHeremans, Paul
dc.date.accessioned2021-10-16T15:05:55Z
dc.date.available2021-10-16T15:05:55Z
dc.date.issued2007-05
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/11747
dc.sourceIIOimport
dc.titleImproved CuTCNQ resistive non-volatile memories and a statistical study on their threshold voltage
dc.typeProceedings paper
dc.contributor.imecauthorGenoe, Jan
dc.contributor.imecauthorHeremans, Paul
dc.contributor.orcidimecGenoe, Jan::0000-0002-4019-5979
dc.contributor.orcidimecHeremans, Paul::0000-0003-2151-1718
dc.source.peerreviewno
dc.source.beginpage135
dc.source.endpage137
dc.source.conference2nd Internation Conference on Memory Technology and Design - ICMTD
dc.source.conferencedate7/05/2007
dc.source.conferencelocationGiens France
imec.availabilityPublished - imec


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