dc.contributor.author | Bogdanowicz, Janusz | |
dc.contributor.author | Dortu, Fabian | |
dc.contributor.author | Clarysse, Trudo | |
dc.contributor.author | Vandervorst, Wilfried | |
dc.contributor.author | Shaughnessy, Derrick | |
dc.contributor.author | Salnick, Alex | |
dc.contributor.author | Nicolaides, Lena | |
dc.contributor.author | Opsal, Jon | |
dc.date.accessioned | 2021-10-16T15:07:41Z | |
dc.date.available | 2021-10-16T15:07:41Z | |
dc.date.issued | 2007 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/11769 | |
dc.source | IIOimport | |
dc.title | Advances in optical carrier profiling through high-frequency modulated optical reflectance | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Bogdanowicz, Janusz | |
dc.contributor.imecauthor | Vandervorst, Wilfried | |
dc.contributor.orcidimec | Bogdanowicz, Janusz::0000-0002-7503-8922 | |
dc.source.peerreview | no | |
dc.source.beginpage | 71 | |
dc.source.endpage | 81 | |
dc.source.conference | International Workshop on INSIGHT in Semiconductor Device Fabrication, Metrology, and Modeling | |
dc.source.conferencedate | 6/05/2007 | |
dc.source.conferencelocation | Napa, CA USA | |
imec.availability | Published - imec | |