dc.contributor.author | Borremans, Jonathan | |
dc.contributor.author | De Locht, Ludwig | |
dc.contributor.author | Wambacq, Piet | |
dc.contributor.author | Rolain, Yves | |
dc.date.accessioned | 2021-10-16T15:08:24Z | |
dc.date.available | 2021-10-16T15:08:24Z | |
dc.date.issued | 2007-04 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/11777 | |
dc.source | IIOimport | |
dc.title | Nonlinearity analysis of analog/RF circuits using combined multisine and volterra analysis | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Wambacq, Piet | |
dc.contributor.orcidimec | Wambacq, Piet::0000-0003-4388-7257 | |
dc.source.peerreview | no | |
dc.source.beginpage | 261 | |
dc.source.endpage | 266 | |
dc.source.conference | Design, Automation and Test in Europe Conference - DATE | |
dc.source.conferencedate | 16/04/2007 | |
dc.source.conferencelocation | Nice France | |
imec.availability | Published - imec | |