Publication:
Characteristic trapping lifetime and capacitance-voltage measurements of GaAs metal-oxide-semiconductor structures
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1828 since deposited on 2021-10-16
2last month
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Acq. date: 2026-08-10
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Statistics
Views
1828 since deposited on 2021-10-16
2last month
1last week
Acq. date: 2026-08-10
Citations