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Characteristic trapping lifetime and capacitance-voltage measurements of GaAs metal-oxide-semiconductor structures
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Authors
Brammertz, Guy
;
Martens, Koen
;
Sioncke, Sonja
;
Delabie, Annelies
;
Caymax, Matty
;
Meuris, Marc
;
Heyns, Marc
Issue
13
Journal
Applied Physics Letters
Volume
91
Title
Characteristic trapping lifetime and capacitance-voltage measurements of GaAs metal-oxide-semiconductor structures
Publication type
Journal article
Embargo date
9999-12-31
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