dc.contributor.author | Brunco, David | |
dc.contributor.author | De Jaeger, Brice | |
dc.contributor.author | Eneman, Geert | |
dc.contributor.author | Satta, Alessandra | |
dc.contributor.author | Terzieva, Valentina | |
dc.contributor.author | Souriau, Laurent | |
dc.contributor.author | Leys, Frederik | |
dc.contributor.author | Pourtois, Geoffrey | |
dc.contributor.author | Houssa, Michel | |
dc.contributor.author | Opsomer, Karl | |
dc.contributor.author | Nicholas, Gareth | |
dc.contributor.author | Meuris, Marc | |
dc.contributor.author | Heyns, Marc | |
dc.date.accessioned | 2021-10-16T15:12:01Z | |
dc.date.available | 2021-10-16T15:12:01Z | |
dc.date.issued | 2007 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/11814 | |
dc.source | IIOimport | |
dc.title | Germanium: the past and possibly a future material for microelectronics | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | De Jaeger, Brice | |
dc.contributor.imecauthor | Eneman, Geert | |
dc.contributor.imecauthor | Terzieva, Valentina | |
dc.contributor.imecauthor | Souriau, Laurent | |
dc.contributor.imecauthor | Pourtois, Geoffrey | |
dc.contributor.imecauthor | Houssa, Michel | |
dc.contributor.imecauthor | Opsomer, Karl | |
dc.contributor.imecauthor | Meuris, Marc | |
dc.contributor.imecauthor | Heyns, Marc | |
dc.contributor.orcidimec | De Jaeger, Brice::0000-0001-8804-7556 | |
dc.contributor.orcidimec | Eneman, Geert::0000-0002-5849-3384 | |
dc.contributor.orcidimec | Souriau, Laurent::0000-0002-5138-5938 | |
dc.contributor.orcidimec | Pourtois, Geoffrey::0000-0003-2597-8534 | |
dc.contributor.orcidimec | Houssa, Michel::0000-0003-1844-3515 | |
dc.contributor.orcidimec | Meuris, Marc::0000-0002-9580-6810 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.beginpage | 479 | |
dc.source.endpage | 483 | |
dc.source.conference | Physics and Technology of High-K Dielectrics | |
dc.source.conferencedate | 7/10/2007 | |
dc.source.conferencelocation | Washington, DC USA | |
imec.availability | Published - open access | |
imec.internalnotes | ECS Trans.; vol. 11, issue 4 | |