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Physical characterization and reliability aspects of MuGFETs

dc.contributor.authorClaeys, Cor
dc.contributor.authorSimoen, Eddy
dc.contributor.authorRafi, J.M.
dc.contributor.authorPavanello, M.A.
dc.contributor.authorMartino, J.A.
dc.date.accessioned2021-10-16T15:20:17Z
dc.date.available2021-10-16T15:20:17Z
dc.date.issued2007
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/11881
dc.sourceIIOimport
dc.titlePhysical characterization and reliability aspects of MuGFETs
dc.typeProceedings paper
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage281
dc.source.endpage294
dc.source.conferenceMicroelectronics Technology and Devices SBMICRO 2007
dc.source.conferencedate3/09/2007
dc.source.conferencelocationRio de Janeiro Brazil
imec.availabilityPublished - open access
imec.internalnotesECS Transactions; Vol. 9, nr. 1


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