Show simple item record

On the field dependence of intrinsic and extrinsic time-dependent dielectric breakdown

dc.contributor.authorDegraeve, Robin
dc.contributor.authorOgier, Jean-Luc
dc.contributor.authorBellens, Rudi
dc.contributor.authorRoussel, Philippe
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorMaes, Herman
dc.date.accessioned2021-09-29T14:25:21Z
dc.date.available2021-09-29T14:25:21Z
dc.date.issued1996
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/1188
dc.sourceIIOimport
dc.titleOn the field dependence of intrinsic and extrinsic time-dependent dielectric breakdown
dc.typeProceedings paper
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorRoussel, Philippe
dc.contributor.imecauthorGroeseneken, Guido
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage44
dc.source.endpage54
dc.source.conferenceInternational Reliability Physics Symposium - IRPS
dc.source.conferencedate29/04/1996
dc.source.conferencelocationDallas, TX USA
imec.availabilityPublished - open access


Files in this item

Thumbnail
Name:
1164.pdf
Size:
1.037Mb
Format:
PDF
View/open

This item appears in the following collection(s)

Show simple item record