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A lock-in approach for photo-conductivity based lifetime measurement

dc.contributor.authorCornagliotti, Emanuele
dc.contributor.authorAgostinelli, Guido
dc.contributor.authorBeaucarne, Guy
dc.contributor.authorPoortmans, Jef
dc.date.accessioned2021-10-16T15:23:27Z
dc.date.available2021-10-16T15:23:27Z
dc.date.issued2007-09
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/11904
dc.sourceIIOimport
dc.titleA lock-in approach for photo-conductivity based lifetime measurement
dc.typeProceedings paper
dc.contributor.imecauthorCornagliotti, Emanuele
dc.contributor.imecauthorPoortmans, Jef
dc.contributor.orcidimecPoortmans, Jef::0000-0003-2077-2545
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage1660
dc.source.endpage1664
dc.source.conferenceProceedings 22nd European Photovoltaic Solar Energy Conference
dc.source.conferencedate3/09/2007
dc.source.conferencelocationMilano Italy
imec.availabilityPublished - open access


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