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Distribution and generation of traps in SiO2/Al2O3 gate stacks
Publication:
Distribution and generation of traps in SiO2/Al2O3 gate stacks
Date
2007
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Crupi, I.
;
Degraeve, Robin
;
Govoreanu, Bogdan
;
Brunco, David
;
Roussel, Philippe
;
Van Houdt, Jan
Journal
Microelectronics Reliability
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1937
since deposited on 2021-10-16
Acq. date: 2025-10-23
Citations
Metrics
Views
1937
since deposited on 2021-10-16
Acq. date: 2025-10-23
Citations