Show simple item record

Distribution and generation of traps in SiO2/Al2O3 gate stacks

dc.contributor.authorCrupi, I.
dc.contributor.authorDegraeve, Robin
dc.contributor.authorGovoreanu, Bogdan
dc.contributor.authorBrunco, David
dc.contributor.authorRoussel, Philippe
dc.contributor.authorVan Houdt, Jan
dc.date.accessioned2021-10-16T15:27:11Z
dc.date.available2021-10-16T15:27:11Z
dc.date.issued2007
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/11930
dc.sourceIIOimport
dc.titleDistribution and generation of traps in SiO2/Al2O3 gate stacks
dc.typeJournal article
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorGovoreanu, Bogdan
dc.contributor.imecauthorRoussel, Philippe
dc.contributor.imecauthorVan Houdt, Jan
dc.contributor.orcidimecRoussel, Philippe::0000-0002-0402-8225
dc.contributor.orcidimecVan Houdt, Jan::0000-0003-1381-6925
dc.source.peerreviewno
dc.source.beginpage525
dc.source.endpage527
dc.source.journalMicroelectronics Reliability
dc.source.issue4_5
dc.source.volume47
imec.availabilityPublished - imec
imec.internalnotesWoDIM 2006 paper


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record