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Characterization, modeling, and optimization of FinFET MOS varactors

dc.contributor.authorDehan, Morin
dc.contributor.authorParvais, Bertrand
dc.contributor.authorSubramanian, Vaidy
dc.contributor.authorGustin, Cedric
dc.contributor.authorLoo, Josine
dc.contributor.authorMercha, Abdelkarim
dc.contributor.authorDecoutere, Stefaan
dc.date.accessioned2021-10-16T15:42:45Z
dc.date.available2021-10-16T15:42:45Z
dc.date.issued2007-01
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/12027
dc.sourceIIOimport
dc.titleCharacterization, modeling, and optimization of FinFET MOS varactors
dc.typeProceedings paper
dc.contributor.imecauthorParvais, Bertrand
dc.contributor.imecauthorMercha, Abdelkarim
dc.contributor.imecauthorDecoutere, Stefaan
dc.contributor.orcidimecParvais, Bertrand::0000-0003-0769-7069
dc.contributor.orcidimecMercha, Abdelkarim::0000-0002-2174-6958
dc.contributor.orcidimecDecoutere, Stefaan::0000-0001-6632-6239
dc.source.peerreviewno
dc.source.beginpage28
dc.source.endpage31
dc.source.conferenceTopical Meeting on Silicon Monolithic Integrated Circuits in RF Systems
dc.source.conferencedate10/01/2007
dc.source.conferencelocationLong Beach, CA USA
imec.availabilityPublished - imec


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