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dc.contributor.authorDierickx, Bart
dc.date.accessioned2021-10-16T15:51:00Z
dc.date.available2021-10-16T15:51:00Z
dc.date.issued2007-06
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/12073
dc.sourceIIOimport
dc.titleVariability limits the advantage of a photo diode's zero bias operation
dc.typeMeeting abstract
dc.source.peerreviewyes
dc.source.conferenceIEEE Workshop on Image Sensors
dc.source.conferencedate6/06/2007
dc.source.conferencelocationOgunquit, ME USA
imec.availabilityPublished - imec


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