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An improved free-space technique modelling for measuring dielectric properties of materials

dc.contributor.authorDhondt, Geert
dc.contributor.authorDe Zutter, Daniel
dc.contributor.authorMartens, Luc
dc.date.accessioned2021-09-29T14:27:34Z
dc.date.available2021-09-29T14:27:34Z
dc.date.issued1996
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/1208
dc.sourceIIOimport
dc.titleAn improved free-space technique modelling for measuring dielectric properties of materials
dc.typeProceedings paper
dc.contributor.imecauthorDe Zutter, Daniel
dc.contributor.imecauthorMartens, Luc
dc.source.peerreviewno
dc.source.beginpage180
dc.source.endpage183
dc.source.conferenceIEEE Antennas and Propagation Society International Symposium. 1996 Digest; 21-26 July 1996; Baltimore, MD, USA.
dc.source.conferencelocation
imec.availabilityPublished - imec


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