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Improved model to determine the generation lifetime in short channel SOI nMOSFETS

dc.contributor.authorGaleti, M.
dc.contributor.authorMartino, J.A.
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-10-16T16:12:45Z
dc.date.available2021-10-16T16:12:45Z
dc.date.issued2007
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/12179
dc.sourceIIOimport
dc.titleImproved model to determine the generation lifetime in short channel SOI nMOSFETS
dc.typeProceedings paper
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.source.peerreviewno
dc.source.beginpage387
dc.source.endpage392
dc.source.conferenceSilicon-on-Insulator Technology and Devices 13
dc.source.conferencedate6/05/2007
dc.source.conferencelocationChicago, IL USA
imec.availabilityPublished - imec
imec.internalnotesECS Trans.; Vol.6, nr.4


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