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Improved model to determine the generation lifetime in double gate SOI nMOSFETs
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Authors
Galeti, M.
;
Martino, J.A.
;
Simoen, Eddy
;
Claeys, Cor
Conference
Microelectonics Technology and Devices SBMICRO 2007
Title
Improved model to determine the generation lifetime in double gate SOI nMOSFETs
Publication type
Proceedings paper
Embargo date
9999-12-31
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